Instrument Database

General information

Instrument specification

  • Technical aspects

    EDX detector, HAADF detector;

    Tomography holder;

    heating(RT-1000°C)/cooling(lN2-70°C) holder;

    Electrical Biasing holder;

    Monochromator

  • In-situ capabilities
    Temperatures, Electrical biasing
  • Correlated workflow
    Correlation with FIB/SEM and any other technique that allows marking of specimen positions for FIB/SEM.

Contact

Instrument location

  • Building
    NW1
  • Room
    O0050
  • Faculty
    Fachbereich 1
  • Institute University
    IFP
Updated by: MAPEX