Gate Stress Test

Gate-Capacitance (CV) Measurement

• HF gate-capacitance measurement (10kHz, 100kHz, 1MHz)
  • Voltage sweep max. ± 40V

Time Dependant Dielectric Breakdown (TDDB)

• Constant Voltage Stress (CVS)
  • 32 / 128 channel low voltage DAQ
  • Voltage ≤ 100V
  • Current ≥ 50nA
  • Temperature: 30 - 175°C
• Constant Current Stress (CCS)
  • Single device test
  • Possible down to nA
  • Temperature up to 150°C