Xradia 520 Versa

Allgemeine Informationen

Untersuchungsgebiete
3D Materials Analytics
Techniken
3D X-ray Microscopy
Hersteller
ZEISS
Herstellungsjahr
2016
Gemessene Gr??e
True 3D spatial arrangement of X-ray absorption in the sample
Hauptanwendung
Non-destructive testing, characterization of the 3D microstructure of industrial or geologic materials, biologic tissues etc.
In-situ, real-time kompatibel
Ja
Korrelierter Arbeitsablauf verfügbar
Ja
Einrichtung
Der Zugang zu diesem Ger?t ist über die MAPEX Core Facility for Materials Analytics m?glich.

Technische Aspkete
two-stage geometric and optical magnification based on high resolution optics, (0.4X, 4X and 20X objectives) to provide submicron resolution at large working distances, for a large range of sample sizes
diffraction contrast tomography for unlocking crystallographic information (mapping of grain orientations)
flexible, high contrast imaging for challenging materials—low atomic number (low Z) materials, soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast
in-situ-stage to characterize the microstructure of materials in native-like environments (under variation of pressure, tensile or temperature) as well as the evolution of properties over time (4D)
In-situ-M?glichkeiten
Mechanical in-situ test stage
Korrelierter Arbeitsablauf
A correlated workflow from XRM to SEM (Auriga 40, IMSAS) in terms of sample positioning / localized analyses is possible via the Atlas software (ZEISS)

Aktualisiert von: MAPEX