Instrument Database

Spectroscopy

Omicron STM/XPS/LEED

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Allgemeine Informationen

Spezifikationen des Ger?ts

  • Technische Aspkete

    Typical samples are epitaxial thin film system on substrates and single crystals (polycrystalline and amorphous samples can also be examined);

    The sample dimensions are restricted to max.10x10x3mm. Due to the UHV precautions, all samples are required to be very clean;

    For in-situ sample treatment, the maximum scan area of the STM is 1000 nm X 1000 nm;

    The XPS provides an energy resolution of approximately 0.3 eV, with characteristic x-ray radiation of Al (1486.6 eV) and Mg (1253.6 eV) for excitation.

  • In-situ-M?glichkeiten
    Electron beam and direct resistive heating options as well as argon sputtering are available.
  • Weitere Untersuchungsm?glichkeiten
    The instrument provides scanning tunneling microscopy/spectroscopy (STM/STS), low energy electron diffraction (LEED) and x-ray photoelectron spectroscopy (XPS) under ultra-high vacuum (UHV).

Kontaktperson

Ger?testandort

  • Gruppe
    AG Falta
  • Geb?ude
    NW 1
  • Raum
    M0060
  • Fachbereich
    Fachbereich 1
  • Institut Der Universit?t Bremen
    IFP
Aktualisiert von: MAPEX