General information

• Investigation area

  Electron Microscopy
• Techniques

  Scanning Electron Microscopy
  
• Manufacturer

  Jeol
• Fabrication year

  2011
• Main application

  Scanning Electron Microscopy
• Facility

  Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Instrument specification

• Technical aspects

   SE and BE detectors;

  EDX detector for quantitative chemical analysis;

  Jeol JSM-6510 Scanning Electron Microscope with W-emitter (maximum resolution 3 nm @ 30 kV);

  Detectors: Secondary electrons; backscattered electrons;

  Bruker X-Flash solid state detector for X-ray spectroscopy, enabling qualitative and quantitative analysis, analysis along line profiles and sample mapping.

Contact

• Application scientist

  Lars Robben
  Fachbereich 2 , IACK
  NW2/C3051
  Phone number 63142
  lrobbenprotect me ?!uni-bremenprotect me ?!.de
• Principal investigator

  Thorsten Gesing
  

Instrument location

• Group

  Chemische Kristallographie fester Stoffe
• Building

  NW2
• Room

  C3230
• Faculty

  Fachbereich 2
• Institute

  IACK