Instrument Database

Allgemeine Informationen

Spezifikationen des Ger?ts

  • Technische Aspkete

     SE and BE detectors;

    EDX detector for quantitative chemical analysis;

    Jeol JSM-6510 Scanning Electron Microscope with W-emitter (maximum resolution 3 nm @ 30 kV);

    Detectors: Secondary electrons; backscattered electrons;

    Bruker X-Flash solid state detector for X-ray spectroscopy, enabling qualitative and quantitative analysis, analysis along line profiles and sample mapping.

Kontaktperson

Ger?testandort

  • Gruppe
    Chemische Kristallographie fester Stoffe
  • Geb?ude
    NW2
  • Raum
    C3230
  • Fachbereich
    Fachbereich 2
  • Institut (Au?eruniversit?r)
    IACK
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