Instrument Database

Surface Analytics

FastScanning AFM

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Allgemeine Informationen

Spezifikationen des Ger?ts

  • Technische Aspkete

    Scan head for fast measurements (100 Hz), FOV =  30 ?m x 30 ?m

    Low noise level < 200 pm RMS

    Second scan head for large FOVs up to 80 ?m x 80 ?m

    Measurement modes include contact, tapping, phase imaging, force spectroscopy, electrochemical potential

  • In-situ-M?glichkeiten
    Measurements in fluid cells with fluid temperature up to 60°C

Kontaktperson

Ger?testandort

  • Gruppe
    Mineralogy
  • Geb?ude
    GEO
  • Raum
    3220
  • Fachbereich
    Fachbereich 5
Aktualisiert von: MAPEX