Low-energy electron microscope

General information

Investigation area
Spectroscopy
Techniques
Low-energy Electron Microscopy
Manufacturer
Elmitec
Fabrication year
2010
Measured quantity
surface morphology, surface structure
Main application
in situ structural characterization of near-surface transformation processes in real-time
In-situ, real-time compatible
Yes
Facility
Access to this instrument is possible via the MAPEX Core Facility for Materials Analytics

Technical aspects
Low-energy electron microscopy is a full-field diffractive imaging technique that allows imaging the morphology and surface structure of a crystalline sample at a lateral resolution down to about 10 nm for fields of view in the range of 3 to 50 microns at video rates (~10 Hz). Vertical resolution is limited to imaging of atomic surface steps.
Preferred sample characteristics: flat, mono- or polycrystalline specimens up to 9x9 mm2, thickness up to 2 mm
In-situ capabilities
Temperature range during operation: 300 - 1300 K; Gas dosing from ultra-high vacuum up to 10-4 mbar during operation;

Application scientist
Jon-Olaf Krisponeit
Fachbereich 1
NW 1, W4120
Phone number 62248
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Jens Falta
Fachbereich 1
NW 1, W4190
Phone number 62244
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Principal investigator
Jens Falta

Updated by: MAPEX