A complete overhaul of the Zeiss EM900 TEM was funded by MAPEX

Transmission electron microscopy is an established technique for imaging of nanoscale materials using a beam of electrons that is transmitted through the specimen.

The upgrade includes:  Complete replacement of the previous control electronics and vacuum control. The TEM is now able to perform selected area electron diffraction (SAED). SAED provides diffractograms of specimen, which, depending on the focus, can comprise a single nanoparticle or individual grains in a polycrystalline material.

Key benefits:   It's ease of operation, allowing even inexperienced researchers to become proficient within two hours, and its rapid sample change, taking under five minutes—or less than one minute for experienced operators.

Features: The EM900 provides accelerating voltages of 50 and 80 kV, an energy range leading to a stronger interaction with the sample especially suitable for nanoparticles and low -Z materials. The microscope delivers high-quality images with a resolution of approximately 5 nm. As with most TEMs, samples are deposited on a carbon-coated copper grid, and analysis takes place at high vacuum conditions.

Applied by:
PD Dr. rer. nat. Michael Maas
(Advanced Ceramics)